not vested
FEI Company supplies scientific instruments for nanoscale applications and solutions for industry and science.
Its products include transmission electron microscopes and scanning electron microscopes (SEMs); DualBeam systems, which include a SEM and focused ion beam system (FIB) on a single platform; stand-alone FIBs; and optical microscopes.
The company offers products used in laboratories to enhance new product development and increase yields by enabling 3D wafer metrology, defect analysis, root cause failure analysis, and circuit edit for modifying device functionality in the semiconductor integrated circuit manufacturing and related industries, such as manufacturers of data storage equipment and other technologies.
It also provides solutions for materials science market that enable scientific discovery and advancement for researchers and help manufacturers develop, analyze, and produce advanced products; and its products are used in mining for automated mineralogy, as well as in root cause failure analysis and quality control applications across a range of industries.
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